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Home: Papers of the Week
Annotation


Roorda S, Sinke WC, Poate JM, Jacobson DC, Dierker S, Dennis BS, Eaglesham DJ, Spaepen F, Fuoss P. Structural relaxation and defect annihilation in pure amorphous silicon. Phys Rev B Condens Matter. 1991 Aug 15;44(8):3702-3725. PubMed Abstract, View on AlzGene

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